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零件编号 | 6MBI225U4-170 | ||
描述 | IGBT Module | ||
制造商 | Fuji Electric | ||
LOGO | |||
1 Page
SPECIFICATION
Device Name : IGBT MODULE
Type Name
: 6MBI225U4-170
Spec. No. :
MS5F 6306
July 15 ’05 S.Miyashita
July 15 ’05 T.Miyasaka
K.Yamada
Y.Seki
MS5F6306
1
14
a
H04-004-07b
Reliability Test Items
Test
cate-
gories
Test items
1 High temperature
Reverse Bias
2 High temperature
Bias (for gate)
3 Temperature
Humidity Bias
4 Intermitted
Operating Life
(Power cycle)
( for IGBT )
Test methods and conditions
Test temp.
Bias Voltage
Bias Method
Test duration
Test temp.
Bias Voltage
Bias Method
Test duration
Test temp.
Relative humidity
Bias Voltage
Bias Method
Test duration
ON time
OFF time
Test temp.
Number of cycles
: Ta = 125±5 ℃
(Tj ≦ 150 ℃)
: VC = 0.8×VCES
: Applied DC voltage to C-E
VGE = 0V
: 1000hr.
: Ta = 125±5 ℃
(Tj ≦ 150 ℃)
: VC = VGE = +20V or -20V
: Applied DC voltage to G-E
VCE = 0V
: 1000hr.
: 85±2 oC
: 85±5%
: VC = 0.8×VCES
: Applied DC voltage to C-E
VGE = 0V
: 1000hr.
: 2 sec.
: 18 sec.
: Tj=100±5 deg
Tj ≦ 150 ℃, Ta=25±5 ℃
: 15000 cycles
Reference
norms
EIAJ ED-4701
(Aug.-2001 edition)
Number
of
sample
Accept-
ance
number
Test Method 101 5 ( 0 : 1 )
Test Method 101 5 ( 0 : 1 )
Test Method 102 5 ( 0 : 1 )
Condition code C
Test Method 106 5 ( 0 : 1 )
Failure Criteria
Item
Characteristic
Symbol
Failure criteria
Unit
Note
Lower limit Upper limit
Electrical
Leakage current
ICES - USL×2 mA
characteristic
±IGES
-
USL×2
A
Gate threshold voltage VGE(th) LSL×0.8 USL×1.2 mA
Saturation voltage
VCE(sat)
-
USL×1.2 V
Forward voltage
VF - USL×1.2 V
Thermal IGBT
VGE
- USL×1.2 mV
resistance
or VCE
FWD
VF - USL×1.2 mV
Isolation voltage
Viso
Broken insulation
-
Visual
Visual inspection
inspection
Peeling
-
The visual sample
-
Plating
and the others
LSL : Lower specified limit.
USL : Upper specified limit.
Note : Each parameter measurement read-outs shall be made after stabilizing the components
at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests.
And in case of the wetting tests, for example, moisture resistance tests, each component
shall be made wipe or dry completely before the measurement.
MS5F6306
8
14
a
H04-004-03a
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页数 | 14 页 | ||
下载 | [ 6MBI225U4-170.PDF 数据手册 ] |
零件编号 | 描述 | 制造商 |
6MBI225U4-170 | Power Devices (IGBT) | ETC |
6MBI225U4-170 | IGBT Module | Fuji Electric |
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