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PDF ( 数据手册 , 数据表 ) LG1600KXH

零件编号 LG1600KXH
描述 LG1600KXH Clock and Data Regenerator
制造商 Agere Systems
LOGO Agere Systems LOGO 


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LG1600KXH 数据手册, 描述, 功能
Data Sheet
June 1999
LG1600KXH Clock and Data Regenerator
Figure 1. LG1600KXH Open View
Features
s Integrated clock recovery and data retiming
s Surface-mount package
s Single ECL supply
s Robust FPLL design
s Operation up to BER = 1e–3
s SONET/SDH compatible loss of signal alarm
s High effective Q allows long run lengths
s Jitter tolerance exceeding ITU-T/Bellcore
s Low clock jitter generation: <0.005 UI
s Standard and custom data rates
0.50 Gbits/s—5.5 Gbits/s
s Complementary 50 I/Os
Applications
s SONET/SDH receiver terminals and regenerators
OC-12 through OC-96/STM-4 through STM-32
s SONET/SDH test equipment
s Proprietary bit rate systems
s Digital video transmission
s Clock doublers and quadruplers







LG1600KXH pdf, 数据表
LG1600KXH Clock and Data Regenerator
Data Sheet
June 1999
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can cause permanent or latent damage to the device. These
are absolute stress ratings only. Functional operation of the device is not implied at these or any other conditions in
excess of those given in the operational sections of the data sheet. Exposure to absolute maximum ratings for
extended periods can adversely affect device reliability.
Table 2. Absolute Maximum Ratings
Parameter
Supply Voltage Range (VSS)
Loss of Signal Bias Voltage (VDD)
Power Dissipation
Voltage (all pins)
Transient Voltage to ac Couple Pins (V±IN, REXT)
Storage Temperature Range
Operating Temperature Range
Min
Max
Unit
–7 0.5 V
—7V
— 2W
VSS 0.5
V
— ±3 V
–40 125 °C
–40 100 °C
Recommended Operating Conditions
Table 3. Recommended Operating Conditions
Parameter
Case Temperature
Power Supply
Symbol
tCASE
VSS
Min
0
–4.7
Max
70
–5.7
Unit
°C
V
Handling Precautions
Although protection circuitry has been designed into this device, proper precautions should be taken to avoid expo-
sure to electrostatic discharge (ESD) during handling and mounting. Lucent Technologies Microelectronics Group
employs a human-body model (HBM) for ESD-susceptibility testing and protection design evaluation. The HBM
(resistance = 1500 , capacitance = 100 pF) is used. The HBM ESD threshold presented in Table 4 was obtained
by using these circuit parameters.
Table 4. ESD Threshold
HBM ESD Threshold
Device
Voltage
LG1600KXH
750 V
Mounting and Connections
Certain precautions must be taken when using solder. For installation using a constant temperature solder, temper-
atures of under 300 °C may be employed for periods of time up to 5 seconds, maximum. For installation with a sol-
dering iron (battery operated or nonswitching only), the soldering tip temperature should not be greater than
300 °C and the soldering time for each lead must not exceed 5 seconds.
8 Lucent Technologies Inc.







LG1600KXH equivalent, schematic
LG1600KXH Clock and Data Regenerator
Ordering Information
Device Code
LG1600KXH0622
LG1600KXH1244
LG1600KXH1250
LG1600KXH1298
LG1600KXH2380
LG1600KXH2488
LG1600KXH2666
TF1004A
Package
Surface-Mount Package
Surface-Mount Package
Surface-Mount Package
Surface-Mount Package
Surface-Mount Package
Surface-Mount Package
Surface-Mount Package
Test Fixture
Data Sheet
June 1999
Temperature
0 °C to 70 °C
0 °C to 70 °C
0 °C to 70 °C
0 °C to 70 °C
0 °C to 70 °C
0 °C to 70 °C
0 °C to 70 °C
Comcode
108418583
108418591
108418609
108418625
108418617
108193087
108418575
106497621
16 Lucent Technologies Inc.










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