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PDF ( 数据手册 , 数据表 ) 5962-87775

零件编号 5962-87775
描述 Standard Microcircuit Drawing
制造商 ETC
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5962-87775 数据手册, 描述, 功能
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REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
A Add device type 02. Technical changes to table 1. Editorial changes
throughout.
B Drawing updated to reflect current requirements. - gt.
81-09-30
04-06-18
APPROVED
N.A. Hauck
R. Monnin
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
REV
B
SHEET
1
PREPARED BY
Marcia B. Kelleher
B
2
CHECKED BY
Charles E. Besore
APPROVED BY
Michael A. Frye
DRAWING APPROVAL DATE
87-12-30
BBBBBBB
3456789
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
MICROCIRCUIT, LINEAR, 5-VOLT POSITIVE
REGULATOR, MONOLITHIC SILICON
AMSC N/A
DSCC FORM 2233
APR 97
REVISION LEVEL
B
SIZE
A
SHEET
CAGE CODE
67268
1 OF 9
5962-87775
5962-E272-04







5962-87775 pdf, 数据表
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TABLE II. Electrical test requirements.
MIL-STD-883 test requirements
Interim electrical parameters
(method 5004)
Final electrical test parameters
(method 5004)
Group A test requirements
(method 5005)
Groups C and D end-point
electrical parameters
(method 5005)
* PDA applies to subgroup 1.
Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
------------------
1*, 2, 3
1, 2, 3, 4
1, 2, 3
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.3.2 Groups C and D inspections.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in method 1005 of MIL-STD-883.
(2) TA = +125°C, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
B
5962-87775
SHEET
8














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