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PDF ( 数据手册 , 数据表 ) 4014BT

零件编号 4014BT
描述 HEF4014B
制造商 NXP Semiconductors
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4014BT 数据手册, 描述, 功能
HEF4014B
8-bit static shift register
Rev. 9 — 21 March 2016
Product data sheet
1. General description
The HEF4014B is a fully synchronous edge-triggered 8-bit static shift register with eight
synchronous parallel inputs (D0 to D7), a synchronous serial data input (DS), a
synchronous parallel enable input (PE), a LOW-to-HIGH edge-triggered clock input (CP)
and buffered parallel outputs from the last three stages (Q5 to Q7).
Operation is synchronous and the device is edge-triggered on the LOW-to-HIGH
transition of CP. Each register stage is of a D-type master-slave flip-flop type. When PE is
HIGH, data is loaded into the register from D0 to D7 on the LOW-to-HIGH transition of CP.
When PE is LOW, data is shifted to the first position from DS, and all the data in the
register is shifted one position to the right on the LOW-to-HIGH transition of CP. The clock
input’s Schmitt trigger action makes it highly tolerant of slower clock rise and fall times.
It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS
(usually ground). Unused inputs must be connected to VDD, VSS, or another input.
2. Features and benefits
Tolerant of slow clock rise and fall times
Fully static operation
5 V, 10 V, and 15 V parametric ratings
Standardized symmetrical output characteristics
Specified from 40 C to +85 C
Complies with JEDEC standard JESD 13-B
3. Applications
Parallel-to-serial converter
Serial data queueing
General purpose register
4. Ordering information
Table 1. Ordering information
All types operate from 40 C to +85 C
Type number Package
Name Description
HEF4014BT
SO16
plastic small outline package; 16 leads; body width 3.9 mm
Version
SOT109-1







4014BT pdf, 数据表
NXP Semiconductors
HEF4014B
8-bit static shift register
Table 9. Measurement points
Supply voltage
VDD
5 V to 15 V
Input
VM
0.5VDD
Output
VM
0.5VDD
9''
9,
*
'87
92
57 &/
DDJ
Fig 6.
Test data is given in Table 10;
Definitions for test circuit:
DUT = Device Under Test.
CL = load capacitance including jig and probe capacitance.
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
Test circuit for measuring switching times
Table 10. Test data
Supply voltage
VDD
5 V to 15 V
Input
VI
VSS or VDD
tr, tf
20 ns
Load
CL
50 pF
HEF4014B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 9 — 21 March 2016
© NXP Semiconductors N.V. 2016. All rights reserved.
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