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PDF ( 数据手册 , 数据表 ) 5962-89841

零件编号 5962-89841
描述 Microcircuit / Memory / CMOS
制造商 Lattice Semiconductor
LOGO Lattice Semiconductor LOGO 


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5962-89841 数据手册, 描述, 功能
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REVISIONS
LTR DESCRIPTION
A Added K package. Added 04 device, two suppliers and 05 device,
one supplier. Added vendor CAGE 34335 for devices 01L, 013, and
02L. Editorial changes throughout. Added vendor CAGE 34335 for
devices 01K, 023, and 02K. Redrawn.
B Added vendor CAGE 65786 for devices 01, 02, 03, 04, and 05LX,
KX, and 3X. Added vendor CAGE 18324 for devices 01, 02, 04, and
05LX. IAW NOR 5962-R079-93.
C Added 06 device for one supplier. Added test tSU2 to table I.
Editorial changes throughout. Redrawn.
D Added devices 07-14, Added CAGE 1FN41 for devices 13 and 14,
added test ICCSB to table I for devices 13 and 14, and updated text to
newer boiler plate.
E Changes in accordance with NOR 5962-R263-97
F Changes in accordance with NOR 5962-R341-97
G Added powerup-reset parameters to table I, and the waveform as
figure 5. Updated boilerplate. ksr
H Changed minimum IOS value for devices 01 thru 06 on table I.
Value was changed from -50 mA to -30 mA. ksr
J Updated boiler plate. ksr
DATE (YR-MO-DA)
91 – 04 – 19
93 – 01 – 28
93 – 07 – 30
97 – 03 – 04
97 – 04 – 23
97 – 06 – 05
98 – 07 – 10
99 – 03 – 19
02 - 10 - 10
APPROVED
M. A. Frye
M. A. Frye
M. A. Frye
Raymond Monnin
Raymond Monnin
Raymond Monnin
Raymond Monnin
Raymond Monnin
Raymond Monnin
REV
SHEET
REV
JJJ
SHEET
15 16 17
REV STATUS
OF SHEETS
REV
SHEET
JJJJJJJJJJJJJ J
1 2 3 4 5 6 7 8 9 10 11 12 13 14
PMIC N/A
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF
DEFENSE
PREPARED BY
Kenneth Rice
CHECKED BY
Charles Reusing
APPROVED BY
Michael A. Frye
DRAWING APPROVAL DATE
89 – 11 – 28
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
http://www.dscc.dla.mil
MICROCIRCUIT, MEMORY, DIGITAL,
CMOS, PROGRAMMABLE ARRAY
LOGIC (EEPLD), MONOLITHIC
SILICON
AMSC N/A
REVISION LEVEL
J
SIZE
A
CAGE CODE
67268
5962-89841
SHEET
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1 OF 17
5962-E540-02







5962-89841 pdf, 数据表
www.DataSheet4U.com
Table I. Electrical performance characteristics - Continued.
Test
Clock pulse width, low
5/
Asynchronous reset pulse
width
Asynchronous reset to
rising clock recovery time
Clock pulse width
5/ 7/
Setup time
5/ 7/
Power up reset time
7/
Symbol
tPWL
tPWR
Conditions
-55°C TC +125°C
VSS = 0 V, 4.5 V VCC 5.5 V
unless otherwise specified
VCC = 4.5 V see figures 3
and 4
4/
Group A Device
subgroups type
9, 10, 11
9, 10, 11
01
02, 14
03, 05
04, 13
07, 10
08, 09,
11
06, 12
7/
01
02, 14
03, 05,
08, 09,
11
04, 07,
10, 13
06, 12
tREC
9, 10, 11
01
tW See figure 5
tS
tPR
9, 10, 11
9, 10, 11
9, 10, 11
02, 14
03, 05
08, 09,
11
04, 07,
10, 13
06, 12
01, 07
04, 10,
13
02, 08,
14
03, 05,
09, 11
06, 12
01, 07
04, 10,
13
02, 08,
14
03, 05,
09, 11
06, 12
All
Limits
Unit
Min Max
20 ns
15
8
15
14
6
3
30 ns
20
15
25
10
30 ns
20
15
12
25
6
20 ns
15
15
8
3.5
25 ns
18
17
12
6
1.0 µs
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
J
5962-89841
SHEET
8







5962-89841 equivalent, schematic
www.DataSheet4U.com
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of
MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (CIN and CI/O/Q measurements) shall be measured only for the initial test and after process or design
changes which may affect capacitance. Sample size is 15 devices with no failures, and all input and output terminals
tested.
d. IOS measurements in subgroup 1 shall be measured only for the initial test and after process or design changes
which may affect IOS. Sample size is 15 devices with no failures, and all output terminals tested.
e. Subgroups 7 and 8 shall be sufficient to verify the truth table.
4.3.2 Group C inspection. Group C inspection shall be in accordance with table III of method 5005 of MIL-STD-883
and as follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1005 of MIL-STD-883.
(2) TA = +125°C, minimum.
(3) Test duration: 1,000 hours except as permitted by method 1005 of MIL-STD-883.
(4) All devices shall be programmed with a pattern that assures all inputs and I/O's are dynamically switched.
c. An extended data retention test shall be added. A new sample shall be selected, and the sample size, accept
number and frequency of testing shall be the same as that required for group C inspection. Extended data retention
shall also consist of the following:
(1) All devices shall have a minimum of 50 percent of the logic array programmed with a charge on all cells,
such that the cell will not be in a neutral state.
(2) Unbiased bake for 1,000 hours (minimum) at +150°C (minimum). The unbiased bake time may be
accelerated by using a higher temperature in accordance with the Arrhenius Relationship:
AF = Acceleration factor (unitless quantity) = t1/t2.
T = Temperature in Kelvin (i.e., °C + 273 = K).
t1 = Time (hrs) at temperature T1.
t2 = Time (hrs) at temperature T2.
K = Boltzmanns constant = 8.62 x 10-5 eV/°K using an apparent activation
energy (EA) of 0.6 eV.
The maximum bake temperature shall not exceed +200°C.
(3) Read the pattern after bake and perform end-point electrical tests in accordance with table II herein for group
C.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
J
5962-89841
SHEET
16










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