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PDF ( 数据手册 , 数据表 ) 5962-85514

零件编号 5962-85514
描述 VOLT REFERENCE
制造商 Analog Devices
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REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
A Change to military drawing format. Changes to output adjustment range. Add
conditions for load regulation test at -55°C and +125°C. Change group A
subgroups for load regulation and line regulation tests, and output voltage
temperature coefficient. Add vendor CAGE 64155. Editorial changes
throughout.
B Add vendor CAGE 07933. Add vendor CAGE 54186. Add case outline 2.
Change output voltage temperature coefficient test limits.
C Add device type 02. Editorial changes throughout. Delete vendors CAGEs
54186 and 07933. Add vendor CAGE 1ES66.
D Add class V devices. Replace CAGE 06665 with 24355. Add case outline H
and TABLE IIB. Make changes to 1.2.2 and TABLE II.
E Add radiation hardness assurance requirements. - ro
F Make changes to 1.5, table IIA, 4.4.1b, and output voltage temperature
coefficient test as specified in table I. - ro
G Add device types 03 and 04. Make changes 1.2.2 and to the output voltage
noise test as specified under TABLE I. - ro
H Drawing updated to reflect current requirements. -rrp
88-03-17
89-04-12
92-11-25
97-06-10
98-08-07
00-01-21
01-02-07
05-12-07
APPROVED
M. A. FRYE
M. A. FRYE
M. A. FRYE
R. MONNIN
R. MONNIN
R. MONNIN
R. MONNIN
R. MONNIN
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.
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CURRENT CAGE CODE 67268
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REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
REV
SHEET
HHHHHHHHHH
1 2 3 4 5 6 7 8 9 10
PMIC N/A
PREPARED BY
DONALD OSBORNE
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
CHECKED BY
DANIEL A. DiCENZO
APPROVED BY
N. A. HAUCK
DRAWING APPROVAL DATE
86-03-08
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
MICROCIRCUIT, LINEAR, RADIATION
HARDENED, +5 VOLT ADJUSTABLE PRECISION
VOLTAGE REFERENCE, MONOLITHIC SILICON
AMSC N/A
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DSCC FORM 2233
APR 97
REVISION LEVEL
H
SIZE
A
SHEET
CAGE CODE
14933
1 OF 10
85514
5962-E061-06
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5962-85514 pdf, 数据表
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3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 59 (see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition B or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
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(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and DteasttateSmhpeeerta4tuUr.ec,oomr approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
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b. Interim and final electrical test parameters shall be as specified in table IIA herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table IIA herein.
b. Subgroups 5, 6, 7, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
MICROCIRCUIT DRAWING
DataSheet4U.com DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
DataSheet4 U .com
SIZE
A
REVISION LEVEL
H
85514
SHEET
8














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