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PDF ( 数据手册 , 数据表 ) 74AHC2G08

零件编号 74AHC2G08
描述 Dual 2-input AND gate
制造商 NXP Semiconductors
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74AHC2G08 数据手册, 描述, 功能
74AHC2G08; 74AHCT2G08
Dual 2-input AND gate
Rev. 5 — 27 November 2013
Product data sheet
1. General description
The 74AHC2G08; 74AHCT2G08 is a high-speed Si-gate CMOS device.
The 74AHC2G08; 74AHCT2G08 provides two 2-input AND gates.
2. Features and benefits
Symmetrical output impedance
High noise immunity
ESD protection:
HBM JESD22-A114E exceeds 2000 V
MM JESD22-A115-A exceeds 200 V
CDM JESD22-C101C exceeds 1000 V
Low power dissipation
Balanced propagation delays
Multiple package options
Specified from 40 C to +80 C and from 40 C to +125 C
3. Ordering information
Table 1. Ordering information
Type number
Package
Temperature range Name
74AHC2G08DP 40 C to +125 C TSSOP8
74AHCT2G08DP
74AHC2G08DC 40 C to +125 C VSSOP8
74AHCT2G08DC
74AHC2G08GD 40 C to +125 C XSON8
74AHCT2G08GD
Description
Version
plastic thin shrink small outline package; 8 leads; body SOT505-2
width 3 mm; lead length 0.5 mm
plastic very thin shrink small outline package; 8 leads; SOT765-1
body width 2.3 mm
plastic extremely thin small outline package; no leads; SOT996-2
8 terminals; body 3 2 0.5 mm







74AHC2G08 pdf, 数据表
NXP Semiconductors
74AHC2G08; 74AHCT2G08
Dual 2-input AND gate
VI
negative
pulse
0V
VI
positive
pulse
0V
90 %
10 %
VM
10 %
tf
tr
90 %
VM
tW
tW
VM
tr
tf
VM
VI
G
VCC
DUT
RT
VO
VCC
RL S1
CL
open
001aad983
Fig 7.
Test data is given in Table 10.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Test circuit for measuring switching times
Table 10. Test data
Type
Input
74AHC2G08
74AHCT2G08
VI
VCC
3V
tr, tf
3 ns
3 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74AHC_AHCT2G08
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5 — 27 November 2013
© NXP B.V. 2013. All rights reserved.
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