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PDF ( 数据手册 , 数据表 ) 5962-90854

零件编号 5962-90854
描述 Hermetically Sealed/ Transistor Output Optocouplers for Analog and Digital Applications
制造商 Agilent(Hewlett-Packard)
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5962-90854 数据手册, 描述, 功能
H
Hermetically Sealed, Transistor
Output Optocouplers for Analog
and Digital Applications
Technical Data
4N55*
5962-87679
HCPL-553X
HCPL-653X
HCPL-655X
5962-90854
HCPL-550X
*See matrix for available extensions.
Features
• Dual Marked with Device
Part Number and DESC
Drawing Number
• Manufactured and Tested on
a MIL-PRF-38534 Certified
Line
• QML-38534, Class H and K
• Five Hermetically Sealed
Package Configurations
• Performance Guaranteed,
Over -55°C to +125°C
• High Speed: Typically
400 kBit/s
• 9 MHz Bandwidth
• Open Collector Output
• 2-18 Volt VCC Range
• 1500 Vdc Withstand Test
Voltage
• High Radiation Immunity
• 6N135, 6N136, HCPL-2530/
-2531, Function
Compatibility
• Reliability Data
Applications
• Military and Space
• High Reliability Systems
• Vehicle Command, Control,
Life Critical Systems
• Line Receivers
• Switching Power Supply
• Voltage Level Shifting
• Analog Signal Ground
Isolation (see Figures 7, 8,
and 13)
• Isolated Input Line Receiver
• Isolated Output Line Driver
• Logic Ground Isolation
• Harsh Industrial
Environments
• Isolation for Test
Equipment Systems
Description
These units are single, dual and
quad channel, hermetically sealed
optocouplers. The products are
capable of operation and storage
over the full military temperature
range and can be purchased as
either standard product or with
full MIL-PRF-38534 Class Level
H or K testing or from the
appropriate DESC Drawing. All
devices are manufactured and
tested on a MIL-PRF-38534
certified line and are included in
the DESC Qualified
Manufacturers List QML-38534
for Hybrid Microcircuits.
Each channel contains a GaAsP
light emitting diode which is
optically coupled to an integrated
photon detector. Separate
connections for the photodiodes
and output transistor collectors
improve the speed up to a
hundred times that of a conven-
tional phototransistor
optocoupler by reducing the
base-collector capacitance.
These devices are suitable for
wide bandwidth analog applica-
tions, as well as for interfacing
TTL to LSTTL or CMOS. Current
Transfer Ratio (CTR) is 9% mini-
mum at IF = 16 mA. The 18 V VCC
Truth Table
(Positive Logic)
Input
On (H)
Off (L)
Output
L
H
Functional Diagram
Multiple Channel Devices
Available
VCC
VB
VO
GND
CAUTION: It is advised that normal static precautions be taken in handling and assembly of this component to
prevent damage and/or degradation which may be induced by ESD.
5965-3002E
1-559







5962-90854 pdf, 数据表
Typical Characteristics, TA = 25°C, VCC = 5 V
Parameter
Symbol Typ. Units
Input Capacitance
Input Diode Temperature
Coefficient
Resistance (Input-Output)
Capacitance (Input-Output)
Transistor DC Current Gain
Small Signal Current
Transfer Ratio
Common Mode Transient
Immunity at Logic High
Level Output
CIN
VF
TA
RI-O
CI-O
hFE
IO
IF
|CMH|
60
-1.5
1012
1.0
250
21
1000
pF
mV/°C
pF
-
%
V/µs
Common Mode Transient
Immunity at Logic Low
|CML| -1000 V/µs
Level Output
Bandwidth
BW 9 MHz
Test Conditions
VF = 0 V, f = 1 MHz
IF = 20 mA
VI-O 500 V
f = 1 MHz
VO = 5 V, IO = 3 mA
VCC = 5 V, VO = 2 V
IF = 0 mA, RL = 8.2 k,
VO (min) = 2.0 V
VCM = 10 VP-P
IF = 16 mA, RL = 8.2 k,
VO (max) = 0.8 V
VCM = 10 VP-P
Fig. Note
1
1
3
1, 11
1
71
10 1, 7
10 1, 7
88
Multi-Channel Product Only
Input-Input Insulation
Leakage Current
Resistance (Input-Input)
Capacitance (Input-Input)
II-I 1 pA Relative Humidity = 45%
VI-I = 500 V, t = 5 s
RI-I 1012 VI-I = 500 V
CI-I 0.8 pF f = 1 MHz
5, 9
5
5
Notes:
1. Each channel of a multi-channel device.
2. Current Transfer Ratio is defined as the ratio of output collector current, IO, to the forward LED input current, IF, times 100%.
CTR is known to degrade slightly over the unit’s lifetime as a function of input current, temperature, signal duty cycle, and system
on time. Refer to Application Note 1002 for more detail. ln short, it is recommended that designers allow at least 20-25%
guardband for CTR degradation.
3. All devices are considered two-terminal devices; measured between all input leads or terminals shorted together and all output
leads or terminals shorted together.
4. The 4N55, 4N55/883B, HCPL-6530 and HCPL-6531 dual channel parts function as two independent single channel units. Use the
single channel parameter limits. IF = 0 mA for channel under test and IF = 20 mA for other channels.
5. Measured between adjacent input pairs shorted together for each multichannel device.
6. tPHL propagation delay is measured from the 50% point on the leading edge of the input pulse to the 1.5 V point on the leading
edge of the output pulse. The tPLH propagation delay is measured from the 50% point on the trailing edge of the input pulse to the
1.5 V point on the trailing edge of the output pulse.
7. CML is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state
(VO < 0.8 V). CMH is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the
logic high state (VO > 2.0 V).
8. Bandwidth is the frequency at which the ac output voltage is 3 dB below the low frequency asymptote. For the HCPL-5530 the
typical bandwidth is 2 MHz.
9. This is a momentary withstand test, not an operating condition.
10. Higher CTR minimums are available to support special applications.
11. Measured between each input pair shorted together and all output connections for that channel shorted together.
12. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and 883B parts receive 100% testing at 25, 125, and
-55°C (Subgroups 1 and 9, 2 and 10, 3 and 11, respectively).
13. Not required for 4N55, 4N55/883B and 5962-8767901 types.
14. Required for 4N55, 4N55/883B and 5962-8767901 types only.
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Agilent(Hewlett-Packard)

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